New work item proposal (NP) är termen som används inom IEC för nya förslag på standardiseringsprojekt.
Är du intresserad av att delta eller få ytterligare information om nya standardiseringsförslag, kontakta SEK kansli på senc@elstandard.se eller telefon 08-444 14 00.
Förslagen kan beställas kostnadsfritt från SEK Svensk Elstandard via formuläret nedan. Antalet kostnadsfria standardiseringsförslag är begränsat till tre. Vid beställning av fler än tre förslag tas en avgift på 300 kr/förslag.
| Benämning IEC | Benämning CLC | Titel | SEK grupp | Deadline |
|---|---|---|---|---|
| 47/2970/NP | PNW 47-2970 ED1: Semiconductor devices - Chip-scale testing for autonomous vehicles -Part 3: Thermal imagers | TC 47 | 2026-01-15 | |
| 62/571/NP | PNW 62-571 ED1: Medical devices – In silico technologies – Part 2: Credibility assessment of first-principles based methods | TC 62 | 2026-01-15 | |
| 62/568/NP | PNW 62-568 ED1: Management systems - Guidelines for incorporating ecodesign in the medical device sector | TC 62 | 2026-01-15 | |
| JTC1-SC43/183/NP | PNW TS JTC1-SC43-183 ED1: Information technology - Brain-computer Interfaces - Testing and post market surveillance protocols for non-medical BCIs | ISO/IEC JTC 1/SC 43 | 2026-01-22 | |
| 8C/153/NP | PNW TS 8C-153 ED1: Business Use Cases (BUCs) of Flexibility Services | TC 8/SC 8C | 2026-01-22 | |
| 91/2077/NP | PNW 91-2077 ED1: Circuit Board 2D Barcode Marking Requirements | TC 91 | 2026-01-22 | |
| 47/2973/NP | PNW 47-2973 ED1: Semiconductor devices - Chip-scale testing for autonomous vehicles - Part 2: Optical performance of LiDAR | TC 47 | 2026-01-22 | |
| 13/1981/NP | PNW 13-1981 ED1: Metrological requirements for in-situ control of EVSE | TC 13 | 2026-01-22 | |
| 13/1980/NP | PNW 13-1980 ED1: Requirements for enabling data exchange between Smart Meter and EVSE | TC 13 | 2026-01-22 | |
| 13/1979/NP | PNW 13-1979 ED1: Requirements for data integrity of EVSE measuring systems | TC 13 | 2026-01-22 | |
| 33/736/NP | PNW 33-736 ED1: DC filter capacitors for HVDC transmission system | TC 33 | 2026-01-22 | |
| 73/238/NP | PNW TS 73-238 ED1: Pressure calculation for electrical installations with rated voltages above AC 1 kV and their installation rooms in the event of an arc fault | TC 73 | 2026-01-22 | |
| 3/1756/NP | PNW TS 3-1756 ED1: Industrial systems, installations and equipment and industrial products - Structuring principles and reference designations - Part 102: Guidelines and requirements for power transmission and distribution systems | TC 3 | 2026-01-29 | |
| JTC1-SC43/184/NP | PNW JTC1-SC43-184 ED1: Information technology - Brain-computer Interfaces - Multi-modal neural data format for BCI | ISO/IEC JTC 1/SC 43 | 2026-01-29 | |
| 59L/306/NP | PNW 59L-306 ED1: Household and similar electrical appliances - Test code for the determination of airborne acoustical noise - Part 2-22: Particular requirements for electrically operated spray seats | TC 59/SC 59L | 2026-01-29 | |
| 33/738/NP | PNW 33-738 ED1: Low-voltage power capacitors - Automatic reactive power controllers for capacitor banks | TC 33 | 2026-02-05 | |
| 62D/2275/NP | PNW 62D-2275 ED1: Medical electrical equipment -- Part 97: Particular requirements for basic safety and essential performance of respiratory home high-flow therapy equipment | TC 62/SC 62D | 2026-02-05 | |
| 94/1179/NP | PNW 94-1179 ED1: Electrical Relays – Electromagnetic Compatibility | TC 94 | 2026-02-05 | |
| 117/242/NP | PNW TS 117-242 ED1: Solar thermal electric plants - Part 4-4: Technical specifications for receiver coatings of solar power tower plants | TC 117 | 2026-02-05 | |
| 86C/2000/NP | PNW 86C-2000 ED1: Fiber Optic Active Components and Devices – Test and Measurement Procedures – Part 8: Universal vertical mezzanine boards for photonic devices | TC 86/SC 86C | 2026-02-05 | |
| 47E/877/NP | PNW 47E-877 ED1: Semiconductor Sensors - Semiconductor Magnetic Current Sensors for Basic and Reinforced Insulation | TC 47/SC 47E | 2026-02-05 | |
| 47E/876/NP | PNW 47E-876 ED1: Semiconductor devices - Part 20: Machine-Interpretable Data Sheet for Power Semiconductors: Requirements for Data Format and Data Access for Power Electronic Design Tools | TC 47/SC 47E | 2026-02-05 | |
| 47F/537/NP | PNW 47F-537 ED1: Micro-electromechanical systems - Part 63: Tensile test of shape-memory MEMS materials under elevated temperature | TC 47/SC 47F | 2026-02-12 | |
| 65C/1378/NP | PNW 65C-1378 ED1: Industrial networks - Fieldbus specifications - Part 4-31: Data-link layer protocol specification - Type 31 elements | TC 65/SC 65C | 2026-02-12 | |
| 65C/1377A/NP | PNW 65C-1377 ED1: Industrial networks – Fieldbus specifications – Part 2-0: Physical layer specification and service definition – General concepts and terminology | TC 65/SC 65C | 2026-02-12 |
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