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New work item proposal, NP

New work item proposal (NP) är termen som används inom IEC för nya förslag på standardiseringsprojekt.

Är du intresserad av att delta eller få ytterligare information om nya standardiseringsförslag, kontakta SEK kansli på senc@elstandard.se eller telefon 08-444 14 00.

Förslagen kan beställas kostnadsfritt från SEK Svensk Elstandard via formuläret nedan. Antalet kostnadsfria standardiseringsförslag är begränsat till tre. Vid beställning av fler än tre förslag tas en avgift på 300 kr/förslag.

Benämning IECBenämning CLCTitelSEK gruppDeadline
94/1205/NPPNW 94-1205 ED1: Electrical relay as interface for use in power applications (industrial and residential use)TC 942026-06-04
34/1442/NPPNW 34-1442 ED1: Lighting systems - Electro-mechanical interfaces - Part 2-2: Two-contact and luminaire interface Type ZB20TC 342026-06-04
SyCSmartCities/425/NPPNW SYCSMARTCITIES-425 ED1: Local Digital Twin Reference ArchitectureSyC Smart Cities2026-06-04
62B/1407/NPPNW TS 62B-1407 ED1: Single fault conditions of magnetic resonance equipment and other considerations for magnetic resonance conditional implant assessmentsTC 62/SC 62B2026-06-04
46F/740/NPPNW TS 46F-740 ED1: Radio frequency connectors - Part 1-11: Standardization of magnetic property evaluation methods for non‑magnetic high‑frequency connectorsTC 46/SC 46F2026-06-04
116/954/NPPNW 116-954 ED1: Electric motor-operated hand-held tools, transportable tools and lawn and garden machinery - Safety - Part 4-15: Particular requirements for battery powered ride-on lawnmowersTC 1162026-06-11
62C/980/NPPNW 62C-980 ED1: Medical electrical equipment - Neutron capture therapy MEE - Functional performance characteristicsTC 62/SC 62C2026-06-11
68/815/NPPNW 68-815 ED1: Permanent magnet (magnetically hard) materials – Methods of measurement of the magnetic properties in an open magnetic circuit using a Pulsed Field MagnetometerTC 682026-06-18
47F/552/NPPNW 47F-552 ED1: Semiconductor devices - Micro-electromechanical devices - Part 64: Test methods of Terahertz sensing antenna-coupled MEMS bolometerTC 47/SC 47F2026-06-18
116/958/NPPNW TS 116-958 ED1: Electric motor‑operated hand‑held hammers and rotary hammers – Guidance for measuring impact energyTC 1162026-06-18
34/1443/NPPNW 34-1443 ED1: Horticultural lighting - LED light sources for horticultural lighting - PerformanceTC 342026-06-18
113/970/NPPNW TS 113-970 ED1: Nanomanufactoring - Key control characteristics - Part 13-1: Surface functionalized nanoparticles - Carboxyl groups content: conductometric titrationTC 1132026-06-25
47E/894A/NPPNW 47E-894 ED1: Semiconductor devices - Part 14-14: Semiconductor sensors - Performance test method for capacitive fingerprint sensorsTC 47/SC 47E2026-06-25
8B/285/NPPNW TS 8B-285 ED1: Microgrid - Part 3-7: Technical requirements - Data center microgrid monitoring, control, and energy management systemTC 8/SC 8B2026-06-25
62A/1735/NPPNW TS 62A-1735 ED1: Medical devices -- Guidance on the application of ISO 14971 -- Part 1: GeneralTC 62/SC 62A2026-06-25
47D/1008/NPPNW 47D-1008 ED1: Thermal standardization on semiconductor packages - Part 2-3: 3D thermal simulation models of semiconductor packages for steady-state analysis - LQFP packagesTC 47/SC 47D2026-06-25
32C/683/NPPNW 32C-683 ED1: Fire-extinguishing thermal-linksTC 32/SC 32C2026-07-02
115/441/NPPNW TS 115-441 ED1: Specification of Functional Performance of Grid-forming VSC-HVDC systemsTC 1152026-07-02
47E/895/NPPNW 47E-895 ED1: Semiconductor devices - Part 14-15: Semiconductor sensors - Performance test method of dynamic vision sensorsTC 47/SC 47E2026-07-02
110/1846/NPPNW 110-1846 ED1:

3D displays - Part 22-3: Measuring methods for autostereoscopic displays - Ambient properties

TC 1102026-06-11
8A/229/NPPNW TS 8A-229 ED1: Interconnection of converter-based resources with power systems - Part 2: General requirements for marine energy generationTC 8/SC 8A2026-07-09
47/3017/NPPNW 47-3017 ED1: Semiconductor device - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 3: Test method for defects using scanning electron microscopyTC 472026-07-09
47/3016/NPPNW 47-3016 ED1: Semiconductor device - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 2: Test method for defects using optical microscopyTC 472026-07-09
JTC1-SC43/208/NPPNW JTC1-SC43-208 ED1: Information technology - Brain-computer Interfaces - Framework for fusion and quality profiling of Non-Invasive BCI dataISO/IEC JTC 1/SC 432026-07-09
51/1618/NPPNW 47-3016 ED1: Semiconductor device - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 2: Test method for defects using optical microscopyTC 512026-07-09
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