New work item proposal, NP
New work item proposal (NP) är termen som används inom IEC för nya förslag på standardiseringsprojekt.
Är du intresserad av att delta eller få ytterligare information om nya standardiseringsförslag, kontakta SEK kansli på senc@elstandard.se eller telefon 08-444 14 00.
Förslagen kan beställas kostnadsfritt från SEK Svensk Elstandard via formuläret nedan. Antalet kostnadsfria standardiseringsförslag är begränsat till tre. Vid beställning av fler än tre förslag tas en avgift på 300 kr/förslag.
| Benämning IEC | Benämning CLC | Titel | SEK grupp | Deadline |
|---|---|---|---|---|
| 113/996/NP | PNW 113-996 ED1: Nanomanufacturing – Requirements for a quality management system | TC 113 | 2026-11-05 | |
| 65B/1352/NP | PNW 65B-1352 ED1: Performance Evaluation Method for Intelligent Remote Terminal Unit | TC 65/SC 65B | 2026-11-05 | |
| 113/998/NP | PNW TS 113-998 ED1: Nanomanufacturing – Key control characteristics – Part 4-17: Nano-enabled energy storage – Manganese dioxide content in cathode material of alkaline zinc-manganese dioxide batteries: iodometric titration method | TC 113 | 2026-11-12 | |
| 34/1506/NP | PNW 34-1506 ED1: Equipment for general lighting purposes – Temporal light artefacts – Part 3: Test method for phantom array effects | TC 34 | 2026-11-12 | |
| 3/1799/NP | PNW 3-1799 ED1: Industrial systems, installations and equipment and industrial products -- Structuring principles and reference designation -- Part 5: Relations | TC 3 | 2026-11-19 | |
| 113/999/NP | PNW 113-999 ED1: Nanomanufacturing – Key control characteristics - Part 11-6: Electromagnetic compatibility – Permittivity of carbon nanotube film: waveguide method | TC 113 | 2026-11-19 | |
| 91/2142/NP | PNW 91-2142 ED1: Circuit board assemblies - Part 8: Voiding in solder joints - Best practices | TC 91 | 2026-11-26 | |
| 65A/1260/NP | PNW 65A-1260 ED1: Batch control - Part 5: Procedure Function Charts | TC 65/SC 65A | 2026-11-26 | |
| 124/403/NP | PNW 124-403 ED1: Wearable electronic devices and technologies - Part 202-2: Test method for e-textile antenna under stretch-induced deformation | TC 124 | 2026-11-26 | |
| 48D/814/NP | PNW 48D-814 ED1: Mechanical structures for electrical and electronic equipment – Walk-in enclosures – Part 1: Design guidelines | TC 48/SC 48D | 2026-11-26 | |
| 2/2327/NP | PNW 2-2327 ED1: Rotating electrical machines – Part 2-4: Specific test methods for determining losses and efficiency of servo motors | TC 2 | 2026-11-05 | |
| 110/1895/NP | PNW 110-1895 ED1: International Electrotechnical Vocabulary (IEV) - Part xxx-02: Electronic technologies and systems - Fundamental concepts of Virtual, Augmented and Mixed Realities | TC 110 | 2026-11-05 | |
| 86C/2041/NP | PNW 86C-2041 ED1: Optical amplifiers – Test methods – Part 10-6: Four wave mixing crosstalk | TC 86/SC 86C | 2026-12-03 | |
| 113/1002/NP | PNW 113-1002 ED1: Nanomanufacturing - Key control characteristics – Part 11-7: Shielding effectiveness of nano-composites based on dielectric nanoparticles: Free-space method | TC 113 | 2026-12-03 | |
| 106/757/NP | PNW 106-757 ED1: Measurement of specific absorption rate – Human exposure to radio frequency electromagnetic fields from hand-held and body-worn wireless communication devices (Frequency range of 4 MHz to 10 GHz) – Part 102: Measuring System Requirements | TC 106 | 2026-11-12 | |
| 23K/142/NP | PNW 23K-142 ED1: Energy Efficiency - Customer Energy Management Systems – 4-1: General requirements for switching devices intended for prosumer electrical installation (PEI) and similar uses | TC 23/SC 23K | 2026-11-12 | |
| SyCLVDC/204/NP | PNW TS SYCLVDC-204 ED1: Fault analysis in hybrid AC/DC systems with isolating converters | SyC LVDC | 2026-11-12 | |
| 81/822/NP | PNW TS 81-822 ED1: Inspection of lightning protection system (LPS) and surge protection measures (SPM) of buildings/structures | TC 81 | 2026-12-10 | |
| 47/3048/NP | PNW 47-3048 ED1: Semiconductor devices - Performance evaluation of semiconductor processing components and inspection equipment - Part 2: Nano-scale wafer surface inspection method using white light interferometry | TC 47 | 2026-12-17 | |
| 124/405/NP | PNW 124-405 ED1: Wearable electronic devices and technologies - Part 201-5: Electronic textile - Cut-out measurement method of sheet resistance of conductive fabric by planer electrode and straight-line electrode | TC 124 | 2026-12-17 | |
| 47E/909/NP | PNW 47E-909 ED1: Semiconductor devices - Test method of pH sensors for metabolic status assessment of cultured cells | TC 47/SC 47E | 2026-12-17 | |
| 21/1322/NP | PNW 21-1322 ED1: Battery data and semantic interoperability | TC 21 | 2026-11-19 | |
| 59F/594/NP | PNW 59F-594 ED1: Surface cleaning appliances - Part 17: Window cleaning robots for household or similar use - Methods for measuring the performance | TC 59/SC 59F | 2026-11-19 | |
| 47/3050/NP | PNW 47-3050 ED1: Semiconductor devices – Neuromorphic devices – Part 7: Evaluation method of synaptic decay time in memristor devices | TC 47 | 2026-12-24 | |
| 38/871/NP | PNW 38-871 ED1: Instrument Transformers - Part 7: Additional requirements for Low Power Voltage Transformers (LPVT) | TC 38 | 2026-12-24 |
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