New work item proposal, NP
New work item proposal (NP) är termen som används inom IEC för nya förslag på standardiseringsprojekt.
Är du intresserad av att delta eller få ytterligare information om nya standardiseringsförslag, kontakta SEK kansli på senc@elstandard.se eller telefon 08-444 14 00.
Förslagen kan beställas kostnadsfritt från SEK Svensk Elstandard via formuläret nedan. Antalet kostnadsfria standardiseringsförslag är begränsat till tre. Vid beställning av fler än tre förslag tas en avgift på 300 kr/förslag.
| Benämning IEC | Benämning CLC | Titel | SEK grupp | Deadline |
|---|---|---|---|---|
| 68/815/NP | PNW 68-815 ED1: Permanent magnet (magnetically hard) materials – Methods of measurement of the magnetic properties in an open magnetic circuit using a Pulsed Field Magnetometer | TC 68 | 2026-06-18 | |
| 47F/552/NP | PNW 47F-552 ED1: Semiconductor devices - Micro-electromechanical devices - Part 64: Test methods of Terahertz sensing antenna-coupled MEMS bolometer | TC 47/SC 47F | 2026-06-18 | |
| 116/958/NP | PNW TS 116-958 ED1: Electric motor‑operated hand‑held hammers and rotary hammers – Guidance for measuring impact energy | TC 116 | 2026-06-18 | |
| 34/1443/NP | PNW 34-1443 ED1: Horticultural lighting - LED light sources for horticultural lighting - Performance | TC 34 | 2026-06-18 | |
| 113/970/NP | PNW TS 113-970 ED1: Nanomanufactoring - Key control characteristics - Part 13-1: Surface functionalized nanoparticles - Carboxyl groups content: conductometric titration | TC 113 | 2026-06-25 | |
| 47E/894A/NP | PNW 47E-894 ED1: Semiconductor devices - Part 14-14: Semiconductor sensors - Performance test method for capacitive fingerprint sensors | TC 47/SC 47E | 2026-06-25 | |
| 8B/285/NP | PNW TS 8B-285 ED1: Microgrid - Part 3-7: Technical requirements - Data center microgrid monitoring, control, and energy management system | TC 8/SC 8B | 2026-06-25 | |
| 62A/1735/NP | PNW TS 62A-1735 ED1: Medical devices -- Guidance on the application of ISO 14971 -- Part 1: General | TC 62/SC 62A | 2026-06-25 | |
| 47D/1008/NP | PNW 47D-1008 ED1: Thermal standardization on semiconductor packages - Part 2-3: 3D thermal simulation models of semiconductor packages for steady-state analysis - LQFP packages | TC 47/SC 47D | 2026-06-25 | |
| 32C/683/NP | PNW 32C-683 ED1: Fire-extinguishing thermal-links | TC 32/SC 32C | 2026-07-02 | |
| 115/441/NP | PNW TS 115-441 ED1: Specification of Functional Performance of Grid-forming VSC-HVDC systems | TC 115 | 2026-07-02 | |
| 47E/895/NP | PNW 47E-895 ED1: Semiconductor devices - Part 14-15: Semiconductor sensors - Performance test method of dynamic vision sensors | TC 47/SC 47E | 2026-07-02 | |
| 8A/229/NP | PNW TS 8A-229 ED1: Interconnection of converter-based resources with power systems - Part 2: General requirements for marine energy generation | TC 8/SC 8A | 2026-07-09 | |
| 47/3017/NP | PNW 47-3017 ED1: Semiconductor device - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 3: Test method for defects using scanning electron microscopy | TC 47 | 2026-07-09 | |
| 47/3016/NP | PNW 47-3016 ED1: Semiconductor device - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 2: Test method for defects using optical microscopy | TC 47 | 2026-07-09 | |
| JTC1-SC43/208/NP | PNW JTC1-SC43-208 ED1: Information technology - Brain-computer Interfaces - Framework for fusion and quality profiling of Non-Invasive BCI data | ISO/IEC JTC 1/SC 43 | 2026-07-09 | |
| 51/1618/NP | PNW 47-3016 ED1: Semiconductor device - The recognition criteria of defects in indium phosphide epitaxial wafers - Part 2: Test method for defects using optical microscopy | TC 51 | 2026-07-09 | |
| 8A/230/NP | PNW TS 8A-230 ED1: Interconnection of converter-based resources with power systems - Part 10: Framework for the capability and performance of grid forming functions | TC 8/SC 8A | 2026-06-18 | |
| JTC1-SC25/3361/NP | PNW TS JTC1-SC25-3361 ED1: Information technology – Generic cabling systems – Part 100: Classification of optical fibre channels | ISO/IEC JTC 1/SC 25 | 2026-07-16 | |
| 47F/555/NP | PNW 47F-555 ED1: Semiconductor devices - Micro-electromechanical devices - Part 65: Test methods for electrical stimulation environment and Electrophysiological measurement using 3D Cell-tissues Models with MEMS chips | TC 47/SC 47F | 2026-07-16 | |
| 69/1136/NP | PNW 69-1136 ED1: Standard interface for connecting charging stations to local energy management systems - Part 4-1: Test specifications (Use Cases) | TC 69 | 2026-07-30 | |
| 77C/365/NP | PNW 77C-365 ED1: IEC 61000-2-X: Electromagnetic Compatibility (EMC) – Part 2-X: Environment – Description of Geomagnetic Disturbance (GMD) environment - Radiated and Conducted disturbance. | TC 77/SC 77C | 2026-08-06 | |
| 8B/289/NP | PNW TS 8B-289 ED1: Decentralized multi-energy systems - Integration of Power-to-X (P2X) systems into decentralized energy systems - Part 2-1: General principles, framework, and use cases | TC 8/SC 8B | 2026-08-06 | |
| 9/3355/NP | PNW 9-3355 ED1: Railway applications - Fixed installations - Requirements for the validation of simulation tools used for the design of electric traction power supply systems | TC 9 | 2026-07-09 | |
| CIS/H/565/NP | PNW CIS/H-565 ED1: Electromagnetic compatibility (EMC) – Part 6-9: Generic standards – Emission standard for equipment in low Earth orbit | CISPR/CIS/H | 2026-08-06 |
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