New work item proposal, NP
New work item proposal (NP) är termen som används inom IEC för nya förslag på standardiseringsprojekt.
Är du intresserad av att delta eller få ytterligare information om nya standardiseringsförslag, kontakta SEK kansli på senc@elstandard.se eller telefon 08-444 14 00.
Förslagen kan beställas kostnadsfritt från SEK Svensk Elstandard via formuläret nedan. Antalet kostnadsfria standardiseringsförslag är begränsat till tre. Vid beställning av fler än tre förslag tas en avgift på 300 kr/förslag.
| Benämning IEC | Benämning CLC | Titel | SEK grupp | Deadline |
|---|---|---|---|---|
| 23H/622/NP | PNW TS 23H-622 ED1: Plugs, socket-outlets, vehicle connectors and vehicle inlets - Conductive charging of electric vehicles - Part 3-2: System LL / Configuration LL EV Coupler | TC 23/SC 23H | 2026-10-22 | |
| 65/1239/NP | PNW TS 65-1239 ED1: Agents in industrial automation – Part 2: Use Cases | TC 65 | 2026-10-22 | |
| 65E/1230/NP | PNW 65E-1230 ED1: Interoperability for machinery | TC 65/SC 65E | 2026-10-29 | |
| 47/3035/NP | PNW 47-3035 ED1: Semiconductor devices - Performance evaluation of semiconductor components and inspection equipment- Part 5: Evaluation methods for composition uniformity in laser dicing process | TC 47 | 2026-10-29 | |
| 86B/5268/NP | PNW 86B-5268 ED1: Fibre optic interconnecting devices and passive components - Fibre optic connector interfaces - Part 7-11: Type MPO connector family for weakly coupled 4-core fibres – One fibre row 12 fibres wide | TC 86/SC 86B | 2026-10-29 | |
| 113/996/NP | PNW 113-996 ED1: Nanomanufacturing – Requirements for a quality management system | TC 113 | 2026-11-05 | |
| 65B/1352/NP | PNW 65B-1352 ED1: Performance Evaluation Method for Intelligent Remote Terminal Unit | TC 65/SC 65B | 2026-11-05 | |
| 113/998/NP | PNW TS 113-998 ED1: Nanomanufacturing – Key control characteristics – Part 4-17: Nano-enabled energy storage – Manganese dioxide content in cathode material of alkaline zinc-manganese dioxide batteries: iodometric titration method | TC 113 | 2026-11-12 | |
| 34/1506/NP | PNW 34-1506 ED1: Equipment for general lighting purposes – Temporal light artefacts – Part 3: Test method for phantom array effects | TC 34 | 2026-11-12 | |
| 47F/570/NP | PNW 47F-570 ED1: Semiconductor devices - Micro-electromechanical devices - Part 67: Microfluidic device for droplet-based 3D cell cultivation | TC 47/SC 47F | 2026-10-22 | |
| 47F/569/NP | PNW 47F-569 ED1: Semiconductor devices - Micro-electromechanical devices - Part 66: Test method for processing electrophysiological impedance data obtained from 3D cell-tissue models in MEMS chip array-based high-throughput screening systems | TC 47/SC 47F | 2026-10-22 | |
| 3/1799/NP | PNW 3-1799 ED1: Industrial systems, installations and equipment and industrial products -- Structuring principles and reference designation -- Part 5: Relations | TC 3 | 2026-11-19 | |
| 113/999/NP | PNW 113-999 ED1: Nanomanufacturing – Key control characteristics - Part 11-6: Electromagnetic compatibility – Permittivity of carbon nanotube film: waveguide method | TC 113 | 2026-11-19 | |
| SyCLVDC/203/NP | PNW SRD SyCLVDC-203 ED1: Management of active parts and exposed conductive parts with isolated converters | SyC LVDC | 2026-10-22 | |
| SyCLVDC/202/NP | PNW SRD SyCLVDC-202 ED1: Management of active parts and exposed conductive parts with non isolated converters | SyC LVDC | 2026-10-22 | |
| 91/2142/NP | PNW 91-2142 ED1: Circuit board assemblies - Part 8: Voiding in solder joints - Best practices | TC 91 | 2026-11-26 | |
| 65A/1260/NP | PNW 65A-1260 ED1: Batch control - Part 5: Procedure Function Charts | TC 65/SC 65A | 2026-11-26 | |
| 124/403/NP | PNW 124-403 ED1: Wearable electronic devices and technologies - Part 202-2: Test method for e-textile antenna under stretch-induced deformation | TC 124 | 2026-11-26 | |
| 45A/1671/NP | PNW TS 45A-1671 ED1: Nuclear Facilities – Instrumentation, Control and Electrical Power Systems – Explainability Aspects of Artificial Intelligence Applications | TC 45/SC 45A | 2026-10-29 | |
| 48D/814/NP | PNW 48D-814 ED1: Mechanical structures for electrical and electronic equipment – Walk-in enclosures – Part 1: Design guidelines | TC 48/SC 48D | 2026-11-26 | |
| 2/2327/NP | PNW 2-2327 ED1: Rotating electrical machines – Part 2-4: Specific test methods for determining losses and efficiency of servo motors | TC 2 | 2026-11-05 | |
| 110/1895/NP | PNW 110-1895 ED1: International Electrotechnical Vocabulary (IEV) - Part xxx-02: Electronic technologies and systems - Fundamental concepts of Virtual, Augmented and Mixed Realities | TC 110 | 2026-11-05 | |
| 86C/2041/NP | PNW 86C-2041 ED1: Optical amplifiers – Test methods – Part 10-6: Four wave mixing crosstalk | TC 86/SC 86C | 2026-12-03 | |
| 113/1002/NP | PNW 113-1002 ED1: Nanomanufacturing - Key control characteristics – Part 11-7: Shielding effectiveness of nano-composites based on dielectric nanoparticles: Free-space method | TC 113 | 2026-12-03 | |
| 106/757/NP | PNW 106-757 ED1: Measurement of specific absorption rate – Human exposure to radio frequency electromagnetic fields from hand-held and body-worn wireless communication devices (Frequency range of 4 MHz to 10 GHz) – Part 102: Measuring System Requirements | TC 106 | 2026-11-12 |
SEK Svensk Elstandard
Post: Box 1042, 172 21 Sundbyberg
Besök: Englundavägen 7D, 171 41 Solna
E-post: sek@elstandard.se
Tel: 08-444 14 00
Members of
Faställer all svensk standard inom elområdet | Copyright 2026 © SEK Svensk Elstandard